RF SQUID behaviour in YBCO thick films up to 85 K

Abstract
RF SQUID behaviour has been observed in screen-printed thick film of YBCO up to 85 K. A hole shunted with a microbridge type of geometry has been made manually on the film. Phase reversal in V- Phi behaviour, which is a characteristic feature of the RF SQUID, is also observed at 77 K. The flux noise spectrum has been found to depend sensitively on the quality of the film. Films containing 123 phase as well as 211 phase show more 1/f noise than films containing only 123 phase.
Keywords

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