Modelling damaged MFM tips using triangular charge sheets
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 31 (6) , 3355-3357
- https://doi.org/10.1109/20.490380
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Magnetic force microscopy with batch-fabricated force sensorsJournal of Applied Physics, 1991