An asymmetric model for XPS analysis

• 1 June 1982
• journal article
• research article
• Published by Wiley in Surface and Interface Analysis
• Vol. 4  (3) , 77-88
• https://doi.org/10.1002/sia.740040302

Abstract

Keywords

• ASYMMETRIC MODEL
• KERNEL
• SPREADING
• PROCEDURES
• SPECTRA
• PHOTOELECTRON
• FITS
• FORMS