Carrier tunneling related phenomena in thin oxide MOSFET's

• 1 January 1983
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 194-197
• https://doi.org/10.1109/iedm.1983.190474

Abstract

Keywords

• TUNNELING
• ELECTRONS
• VOLTAGE
• CHARGE CARRIER PROCESSES
• NONVOLATILE MEMORY
• LABORATORIES
• PROM
• EPROM
• SILICON
• MARINE VEHICLES