Correct determination of lifetime for minority carriers in high-resistivity silicon—minimal thickness needed

1 June 1966

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 2 (6) , 223-224
https://doi.org/10.1049/el:19660189

Abstract

The minimal sample thickness needed to obtain a correct value of the lifetime of minority carriers is given. This thickness is 2.5 times the diffusion length for 500 Ωcm silicon and 1.5 times the diffusion length for 10000 Ωcm silicon.

Keywords

SEMICONDUCTORS