Querschnittspräparation für die Untersuchung von dünnen Schichten, Grenzflächen, Pulvern und Fasern im Transmissionselektronenmikroskop / The Preparation of Cross Sections for the Examination of Thin Layers, Interfaces, Powders and Fibres in the Transmission Electron Microscope
- 1 June 1994
- journal article
- research article
- Published by Walter de Gruyter GmbH in Practical Metallography
- Vol. 31 (6) , 290-306
- https://doi.org/10.1515/pm-1994-310605
Abstract
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