Calibrations for the electrical potential method of crack growth measurement by a direct electrical analogy

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Abstract
A direct analogue method is introduced for obtaining calibration curves relating increase in voltage and crack length for the electrical potential method of measuring crack growth. The numerical results obtained from the analogue are justified by comparison with theoretical predictions. The method is compared with other techniques for obtaining calibrations. Finally, results are presented for plate specimens with various central notches, the S.E.N. bend specimen and the C.K.S. fracture toughness specimen.