The inadequacy of the stuck-at fault model for testing mos lsi circuits: a review of mos failure mechanisms and some implications for computer-aided design and test of mos lsi circuits
- 1 January 1984
- journal article
- review article
- Published by Institution of Engineering and Technology (IET) in Software & Microsystems
- Vol. 3 (2) , 30
- https://doi.org/10.1049/sm.1984.0011
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A fault tolerant MOS-LSI for train controller applicationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983
- Microcircuit Accelerated Testing Reveals Life Limiting Failure Modes8th Reliability Physics Symposium, 1977