Characterization of ultrathin Ge epilayers on (100) Si

• 1 March 1991
• journal article
• Published by Canadian Science Publishing in Canadian Journal of Physics
• Vol. 69  (3-4) , 246-254
• https://doi.org/10.1139/p91-041

Abstract

Keywords

• ULTRATHIN GE EPILAYERS
• CHARACTERIZATION OF ULTRATHIN GE