Energetics in the initial stage of oxidation of silicon

Abstract
We present microscopic calculations of the energetics in the initial stage of oxidation of Si. We find that an O2 molecule penetrates the oxygen-covered surface, dissociates near a bond-center site, and forms a peculiar bond configuration with Si atoms exothermically. We also find that the bond formation results in several oxidation states of the Si atoms at the interface and in a swelling of the Si-O-Si bond network from the surface.