Energetics in the initial stage of oxidation of silicon
- 15 April 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 43 (11) , 9287-9290
- https://doi.org/10.1103/physrevb.43.9287
Abstract
We present microscopic calculations of the energetics in the initial stage of oxidation of Si. We find that an molecule penetrates the oxygen-covered surface, dissociates near a bond-center site, and forms a peculiar bond configuration with Si atoms exothermically. We also find that the bond formation results in several oxidation states of the Si atoms at the interface and in a swelling of the Si-O-Si bond network from the surface.
Keywords
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