Hydrogen passivation of interface defects in GaAs/AlAs short-period superlattices

Abstract
We have observed an increase of overall luminescence intensity and carrier lifetimes of GaAs/AlAs short-period superlattices after exposure of the samples to low-energy hydrogen ion-gun irradiation. We conclude from our data that interface defects which may become important as nonradiative recombination centers in short-period superlattices with only a few monolayers period can be passivated by hydrogen.