Board test DFT model for computer products
- 1 January 1992
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 367
- https://doi.org/10.1109/test.1992.527845
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Defect Level as a Function of Fault CoverageIEEE Transactions on Computers, 1981