Near-field scanning optical microscopy studies of Cu(In,Ga)Se2 solar cells
- 30 June 1997
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 70 (26) , 3555-3557
- https://doi.org/10.1063/1.119231
Abstract
A near-field scanning optical microscope (NSOM) is used to study the local photoresponse of Cu(In,Ga)Se2 thin film solar cells. The grain boundaries of the small grains (10 μm). In addition, NSOM images show response variations from grain to grain and areas of reduced photoresponse which have no corresponding topography. Photovoltage imaging of the cleaved side of the solar cells reveals the depth and nonuniformities of the actual p-n junction. It is found that the response of the p-n junction varies on a 0.5 μm length scale.Keywords
This publication has 15 references indexed in Scilit:
- Near-field scanning optical microscopy in reflection: A study of far-field collection geometry effectsReview of Scientific Instruments, 1996
- Cu (In,Ga)Se2 thin films and solar cells prepared by selenization of metallic precursorsJournal of Vacuum Science & Technology A, 1996
- An impedance based non-contact feedback control system for scanning probe microscopesReview of Scientific Instruments, 1996
- A nonoptical tip–sample distance control method for near-field scanning optical microscopy using impedance changes in an electromechanical systemReview of Scientific Instruments, 1995
- Structure, chemistry, and growth mechanisms of photovoltaic quality thin-film Cu(In,Ga)Se2 grown from a mixed-phase precursorJournal of Applied Physics, 1995
- Studies of the micro‐ and nanostructure of polycrystalline CdTe and CuInSe2using atomic force and scanning tunneling microscopyProgress In Photovoltaics, 1995
- Accelerated publication 17.1% efficient Cu(In,Ga)Se2‐based thin‐film solar cellProgress In Photovoltaics, 1995
- Characterization of variable-band-gap thin-film Cu(In,Ga)Se2: a simple model for the interdiffusion of In and Ga in alloy structuresSolar Energy Materials and Solar Cells, 1994
- A Microstructural Comparison of Cu(In,Ga)Se2 Thin Films Grown from CuxSe and (In,Ga)2Se3 PrecursorsMRS Proceedings, 1994
- Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric ScaleScience, 1991