Adaption of a low-temperature x-ray Guinier diffractometer for use from 12 to 700 K
- 1 December 1984
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 55 (12) , 1978-1979
- https://doi.org/10.1063/1.1137690
Abstract
With the application of a heater element to a cryostat of a low-temperature Guinier diffractometer and camera a working range from 12 to 700 K is achieved. The heating/cooling rates in the low-temperature range are from 0.5 to 160 K/h and in the high-temperature range from 0.5 to 600 K/h. The sample chamber can be either evacuated or filled with a gas up to a pressure of 0.2 MPa. To increase the accuracy of x-ray intensity measurements rotation of the sample is possible within the whole temperature range.Keywords
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