Spectroscopic ellipsometry and XPS studies of anodic aluminum oxide formation in sulfuric acid
- 1 November 1992
- journal article
- Published by Elsevier in Journal of Electroanalytical Chemistry
- Vol. 339 (1-2) , 167-185
- https://doi.org/10.1016/0022-0728(92)80450-i
Abstract
No abstract availableKeywords
This publication has 35 references indexed in Scilit:
- Real Time Spectroscopic Ellipsometry: In Situ Characterization of Pyrrole ElectropolymerizationJournal of the Electrochemical Society, 1991
- Ellipsometry for thin-film and surface analysisAnalytical Chemistry, 1990
- SSIMS, XPS and microstructural studies of ac‐phosphoric acid anodic films on aluminiumSurface and Interface Analysis, 1990
- Spectroscopic Investigations of Porous and Sealed Anodic Alumina FilmsJournal of the Electrochemical Society, 1989
- Electrochemical Properties of Aluminum in Weakly Acidic Sodium Chloride Solutions: Part I . Influence of the Electrolyte Additives In3+ and Zn2+Journal of the Electrochemical Society, 1989
- Ellipsometry of the Growth and Dissolution of Anodic Oxide Films on Aluminum in Alkaline SolutionJournal of the Electrochemical Society, 1985
- Distribution of Anions and Protons in Oxide Films Formed Anodically on Aluminum in a Phosphate SolutionJournal of the Electrochemical Society, 1984
- Role of chloride ions in the anodic oxidation of aluminiumJournal of Physics D: Applied Physics, 1984
- Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometryPhysical Review B, 1979
- Determination of Optical Constants and Growth Rates of Anodic Alumina by EllipsometryJournal of the Electrochemical Society, 1970