Modeling and verification of single event transients in deep submicron technologies

Publisher Website

13 August 2004

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/relphy.2004.1315445

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Attenuation of single event induced pulses in CMOS combinational logic
IEEE Transactions on Nuclear Science, 1997