Data Acquisition with a Nuclear Microprobe
Open Access
- 1 April 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 28 (2) , 1417-1420
- https://doi.org/10.1109/TNS.1981.4331431
Abstract
Spatially resolved information from the near surfaces of materials can be obtained with a nuclear microprobe. The spatial resolution is determined by the optics of the instrument and radiation damage in the specimen. Two- and three-dimensional maps of elemental concentration may be obtained from the near surfaces of materials. Data are acquired by repeated scans of a constantly moving beam over the region of interest or by counting for a preset integrated charge at each specimen location.Keywords
This publication has 3 references indexed in Scilit:
- Total quantitative recording of elemental maps and spectra with a scanning microprobeJournal of Microscopy, 1979
- The production and use of a nuclear microprobe of ions at MeV energiesNuclear Instruments and Methods, 1979
- A secondary electron imaging system for a nuclear microprobeNuclear Instruments and Methods, 1979