Design for testability — a review of advanced methods
- 31 December 1986
- journal article
- review article
- Published by Elsevier in Microprocessors and Microsystems
- Vol. 10 (10) , 531-539
- https://doi.org/10.1016/0141-9331(86)90049-9
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- A Knowledge-Based System for Designing Testable VLSI ChipsIEEE Design & Test of Computers, 1985
- LOCST: A Built-In Self-Test TechniqueIEEE Design & Test of Computers, 1984
- A Survey of Hardware Accelerators Used in Computer-Aided DesignIEEE Design & Test of Computers, 1984
- Test Generation Algorithms for Computer Hardware Description LanguagesIEEE Transactions on Computers, 1982
- Syndrome-Testable Design of Combinational CircuitsIEEE Transactions on Computers, 1980
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966
- The Residue Number SystemIEEE Transactions on Electronic Computers, 1959