The impact of technology on radiation-hardened integrated circuits

1 January 1969

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

Vol. XII, 156-157
https://doi.org/10.1109/isscc.1969.1154772

Abstract

The physics, process technology, and circuit design of radiation-hardened ICs will be discussed. Appropriate circuit design, plus optimum processing techniques (dielectric isolation, small geometry, controlled assembly methods, etc.) will be shown to improve low-power integrated circuits to the point where they no longer limit most systems exposed to nuclear weapons.

Keywords

INTEGRATED CIRCUIT TECHNOLOGY
IONIZATION
SILICON
TRANSIENT ANALYSIS
ELECTRONIC CIRCUITS
DESIGN ENGINEERING
NUCLEAR WEAPONS
SPACE TECHNOLOGY
NEUTRONS
PHOTOCONDUCTIVITY

This publication has 1 reference indexed in Scilit:

The Transient Response of Transistors and Diodes to Ionizing Radiation
IEEE Transactions on Nuclear Science, 1964