ac method for measuring low-frequency resistance fluctuation spectra
- 1 June 1987
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 58 (6) , 985-993
- https://doi.org/10.1063/1.1139587
Abstract
An ac technique is described for measuring low‐frequency resistance fluctuation spectra with improved sensitivity over dc methods achieved by avoiding preamplifier 1/f noise. The technique, easily implemented with decade resistors and a lock‐in amplifier, allows the current noise of low‐resistance (rf noise of Cr films on film area. Measurements with simultaneous direct and alternating currents provide means to study the noise of nonlinear devices and frequency‐dependent conductors.Keywords
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