Scanning force microscopy analysis of the surface of ion‐irradiated diamond
- 1 February 1995
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 23 (2) , 115-119
- https://doi.org/10.1002/sia.740230212
Abstract
The surface of a natural diamond substrate, a chemical vapour‐deposited diamond epilayer and ion‐irradiated regions are compared using scanning force microscopy. Differences are reported in terms of microtopography, force modulation, lateral force and electric field gradient images.Keywords
This publication has 11 references indexed in Scilit:
- Localised structure of homoepitaxial diamondUltramicroscopy, 1992
- Atomic-force-microscope study of polymer lubricants on silicon surfacesPhysical Review Letters, 1992
- The structure of conducting and non-conducting homoepitaxial diamond filmsDiamond and Related Materials, 1992
- Using force modulation to image surface elasticities with the atomic force microscopeNanotechnology, 1991
- Atomic-scale friction of a tungsten tip on a graphite surfacePhysical Review Letters, 1987
- Volume expansion of diamond during ion implantationPhysical Review B, 1986
- Volume expansion of ion-implanted diamondApplied Physics Letters, 1981
- Hard conducting implanted diamond layersApplied Physics Letters, 1977
- An examination of polished diamond surfaces in the electron microscopeJournal of Physics D: Applied Physics, 1976
- Hopping conductivity in C-implanted amorphous diamond, or how to ruin a perfectly good diamondSolid State Communications, 1976