Structural and electronic characterization of underpotentially deposited copper on gold single crystal probed by in situ X-ray absorption spectroscopy
- 1 January 1991
- journal article
- Published by Elsevier in Electrochimica Acta
- Vol. 36 (11-12) , 1859-1862
- https://doi.org/10.1016/0013-4686(91)85057-e
Abstract
No abstract availableKeywords
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- Surface crystallography by means of electron and ion yield SEXAFSSurface Science, 1982
- New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine StructurePhysical Review Letters, 1971