Selective I/O scan: A diagnosable design technique for VLSI systems
- 1 January 1987
- journal article
- Published by Elsevier in Computers & Mathematics with Applications
- Vol. 13 (5-6) , 485-502
- https://doi.org/10.1016/0898-1221(87)90078-2
Abstract
No abstract availableKeywords
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