Continuous Averaging of X-Ray Diffraction Data Using a Multichannel Analyzer

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Abstract
A continuously averaging system is described in which a multichannel analyzer is coupled to an x‐ray diffractometer. The motion of the arm of the diffractometer is synchronized with the channel advance so that there is a 1 to 1 correspondence between 2θ increments and channels. With this system a weak x‐ray diffraction signal may be scanned repeatedly and the signal built up against the random noise introduced by fluctuations in the generating and detecting system with periods long compared to the channel dwell time. Other convenient uses of the analyzer in handling the x‐ray diffraction data are briefly mentioned.

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