Prospects for high-resolution electron energy-loss experiments with the scanning transmission electron microscope
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 18 (1-4) , 125-129
- https://doi.org/10.1016/0304-3991(85)90129-9
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Study of theedges in thetransition metals and their oxides by electron-energy-loss spectroscopy with comparisons to theoryPhysical Review B, 1982
- Oxygennear-edge fine structure: An electron-energy-loss investigation with comparisons to new theory for selectedTransition-metal oxidesPhysical Review B, 1982
- Inelastic electron scattering spectroscopy of graphite-acceptor compoundsSynthetic Metals, 1981
- Studies of some perovskite oxidation catalysts using dta techniquesThermochimica Acta, 1973
- Core Excitons and the Soft-X-Ray Threshold of SiliconPhysical Review Letters, 1972
- Extreme Ultraviolet Transmission of Crystalline and Amorphous SiliconPhysical Review Letters, 1972
- Evidence of Electron-Electron Scattering from Field EmissionPhysical Review Letters, 1970
- Field-Emission Studies of Electronic Energy Levels of Adsorbed AtomsPhysical Review B, 1970