The effects of point-contact pressure on silicon planar junctions

• 1 June 1965
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 53  (6) , 618-619
• https://doi.org/10.1109/proc.1965.3932

Abstract

Keywords

• SILICON
• STRESS
• PROBES
• PHOTONIC BAND GAP
• P-N JUNCTIONS
• DIODES
• SPACE CHARGE
• CURRENT MEASUREMENT
• ELECTRICAL RESISTANCE MEASUREMENT
• CHARGE MEASUREMENT