Analysis of Composite X-Ray Diffraction Profiles
- 1 April 1960
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 31 (4) , 699-706
- https://doi.org/10.1063/1.1735672
Abstract
The irregular line profiles associated with crystals that have a random structure which is coarse relative to the irradiated area are regarded as the result of the composition of a characteristic distribution and a set of broadening and translating processes. The inversion of this composition is expressed operationally. A differential operator associated with the transform of the intrinsic distribution is introduced. This operator reduces the line profile to the set of broadening and translating elements. The operations are such as may be performed by an analogue computer. Preliminary experiments show that it may be possible to obtain the desired resolution. The effects of ``noise'' and distortion are investigated.This publication has 3 references indexed in Scilit:
- Study of Imperfections of Crystal Structure in Polycrystalline Materials: Low Carbon Alloy and Silicon FerriteJournal of Applied Physics, 1952
- The diffraction of X rays by distorted crystal aggregates - IProceedings of the Physical Society, 1944
- A method of calculating the integral breadths of Debye-Scherrer linesMathematical Proceedings of the Cambridge Philosophical Society, 1942