Layer Growth and Dynamics of Xenon Films Deposited on Ag(111)

Abstract
We have used a surface-plasmon-resonance technique to probe Xe multilayer-film growth dynamics on vapor-deposited Ag(111) from 67 to 85 K. At low temperature, more than 10 statistical layers are observed, but above 75 K, films complete only about 2 layers before nucleating islands. We discuss activation energies, long-term instabilities, and annealing trends, and show that the island nucleation correlates with underlying features of the substrate.