Influence of different Langmuir probe surface cleaning procedures on its I-V characteristics

1 April 1992

journal article
letter
Published by AIP Publishing in Review of Scientific Instruments

Vol. 63 (4) , 2330-2331
https://doi.org/10.1063/1.1142926

Abstract

An influence of different procedures and conditions of cleaning the Langmuir probe surface on its current‐voltage characteristic in a plasma is experimentally studied. It is shown that the electronic bombardment of the probe surface and its ohmic warm‐up lead to a very effective cleaning of the surface.

Keywords

IV CHARACTERISTIC
LANGMUIR PROBE
SURFACE CLEANING
PLASMA DIAGNOSTICS

This publication has 2 references indexed in Scilit:

Influence of Ohmic resistance of a cylindrical Langmuir probe on its I-V characteristic
Review of Scientific Instruments, 1991
V-A characteristic of a cylindrical probe in a plasma with electron flow
Physics Letters A, 1990