Polarization-Modulation FT-IR Reflection Spectroscopy Using a Polarizing Michelson Interferometer

1 November 1987

journal article
research article
Published by SAGE Publications in Applied Spectroscopy

Vol. 41 (8) , 1288-1294
https://doi.org/10.1366/0003702874447167

Abstract

We report the first results obtained on a mid-IR FT spectrometer equipped with a polarizing Michelson interferometer (PMI), and the application examples of polarization spectroscopy are illustrated. A relatively simple method for conversion of a conventional instrument to PMI operation is designed. Specular reflection spectra of poly(vinyl acetate) film on copper and ATR spectra of a Langmuir-Blodgett film on silicon prism are presented.

Keywords

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