Comparison of X-Ray Wavelengths for Powder Diffractometry
- 1 October 1956
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 27 (10) , 1215-1218
- https://doi.org/10.1063/1.1722234
Abstract
Comparative diffractometer measurements were made with several radiations and a NaI · Tl scintillation counter with pulse-height discrimination. Figures of merit for the different wavelengths based on intensity and peak-to-background ratio of a silicon powder specimen were: CuKα 100, MoKα 32, CrKα 10, and WLα 6. Several factors contributing to the figure of merit are discussed.This publication has 5 references indexed in Scilit:
- Errata: Absorption and Counting-Efficiency Data for X-Ray DetectorsReview of Scientific Instruments, 1956
- The use of shorter wavelengths in X-ray diffraction in relation to scintillation countingActa Crystallographica, 1955
- Absorption and Counting-Efficiency Data for X-Ray DetectorsReview of Scientific Instruments, 1955
- Scintillation Counting of Low-Energy Photons and its Use in X-Ray DiffractionReview of Scientific Instruments, 1954
- Single Wave-Length X-Rays for Powder DiffractionJournal of Applied Physics, 1950