Al2O3-Silicon MOS Field Effect Transistors
- 1 February 1969
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 8 (2)
- https://doi.org/10.1143/jjap.8.277
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The Characteristics of Al-Al2O3-Si Structures Formed by Reactive SutteringJapanese Journal of Applied Physics, 1968
- Al2O3-SILICON INSULATED GATE FIELD EFFECT TRANSISTORSApplied Physics Letters, 1968
- The effects of fixed bulk charge on the characteristics of metal-oxide-semiconductor transistorsIEEE Transactions on Electron Devices, 1966