A new scanning microdiffraction technique
- 1 September 1973
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 23 (5) , 283-284
- https://doi.org/10.1063/1.1654890
Abstract
It is shown that scanning display of diffraction patterns is possible with a fixed electron detector placed at the appropriate position in the final image in an electron microscope, if the direction of illumination is varied by means of deflection coils in the wobbler unit. The diameter of the specimen area selected for diffraction study can be as small as 100 Å, depending on detector dimensions and microscope magnification. This technique for microdiffraction has been demonstrated with samples of small gold particles evaporated on a collodion substrate.Keywords
This publication has 3 references indexed in Scilit:
- Diffraction Patterns Obtained by Scanning Electron MicroscopeZeitschrift für Naturforschung A, 1972
- Selected-Zone Dark-Field Electron MicroscopyApplied Physics Letters, 1972
- Accuracy of selected-area microdiffraction in the electron microscopeBritish Journal of Applied Physics, 1960