Reflectron time-of-flight mass spectrometry and laser excitation for the analysis of neutrals, ionized molecules and secondary fragments
- 10 January 1992
- journal article
- review article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 112 (2-3) , 121-166
- https://doi.org/10.1016/0168-1176(92)80001-h
Abstract
No abstract availableKeywords
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