Failure Mechanisms and Device Reliability

• 1 November 1967
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Fourth Annual Symposium on the Physics of Failure in Electronics
• https://doi.org/10.1109/irps.1967.362387

Abstract

Keywords

• FAILURE ANALYSIS
• CHEMICAL ANALYSIS
• SOLIDS
• TESTING
• RELIABILITY ENGINEERING
• DEGRADATION
• SPACE TECHNOLOGY
• KINETIC THEORY
• PHYSICS