The Calibration of the Nanoindenter
- 1 January 1993
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Thin film characterization using a mechanical properties microprobeThin Solid Films, 1987
- A method for interpreting the data from depth-sensing indentation instrumentsJournal of Materials Research, 1986
- Hardness measurement at penetration depths as small as 20 nmPhilosophical Magazine A, 1983