Sputter deposited strontium ferrite films with c-axis oriented normal to the film plane

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Abstract
M‐type strontium ferrite films were deposited by radio‐frequency (rf) sputtering on fused quartz substrates kept at ambient temperatures. The as‐deposited films were amorphous. They crystallized on annealing at a temperature of 800 °C or higher. The films deposited at low rf power and low oxygen to argon ratio showed c‐axis orientation normal to the film plane. The magnetic properties of these films were studied using vibrating sample magnetometer, polar Kerr rotation, and torque magnetometer. The perpendicular M‐H loops for c‐axis oriented films were nearly rectangular with coercivity of the order of 3 kOe.