TSEE Response of Sputtered MgO Films to Low-Energy X-Ray Doses
- 1 August 1990
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 29 (8R)
- https://doi.org/10.1143/jjap.29.1600
Abstract
MgO films doped with various elements have been prepared by means of Ar rf-sputtering and the response of thermally stimulated exoelectron emission (TSEE) to a soft X-ray dose has been measured using a GM counter of the gas flow type. The films doped with 0.1% of KCl or Al2O3 seem to be promising for dosimetry use, showing a sensitivity to X-rays below 2 keV at an exposure level of 0.3 R. To estimate the level, the X-ray energy dependence of the TSEE response is studied and compared with that of typical TL dosimeters.Keywords
This publication has 2 references indexed in Scilit:
- Experimental Study on Soft X-Ray Radiation Emitted from a Laser-Heated Gold CavityJapanese Journal of Applied Physics, 1989
- Thermally Stimulated Exoelectron Emission from Lithium Fluoride for Beta and Gamma DosimetryRadiation Protection Dosimetry, 1983