Test set embedding in a built-in self-test environment
- 13 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 257-263
- https://doi.org/10.1109/test.1989.82306
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The use of linear sums in exhaustive testingComputers & Mathematics with Applications, 1987
- A Class of Test Generators for Built-In TestingIEEE Transactions on Computers, 1983
- Testability and Reliability of LSI.Published by Defense Technical Information Center (DTIC) ,1981
- Syndrome-Testable Design of Combinational CircuitsIEEE Transactions on Computers, 1980
- Transition Count Testing of Combinational Logic CircuitsIEEE Transactions on Computers, 1976