Precise Dielectric Measurements of Low-Loss Materials at Millimeter and Submillimeter Wavelengths
- 1 June 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 25 (6) , 509-512
- https://doi.org/10.1109/tmtt.1977.1129147
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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