A new ellipsometer its principle, realization and performances
- 1 May 1973
- journal article
- Published by IOP Publishing in Nouvelle Revue d'Optique
- Vol. 4 (3) , 159-169
- https://doi.org/10.1088/0335-7368/4/3/305
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation TechniqueReview of Scientific Instruments, 1969
- Ellipsometry Using a Retardation Plate as Compensator*Journal of the Optical Society of America, 1967
- Formulas for Using Wave Plates in Ellipsometry*Journal of the Optical Society of America, 1967
- Ellipsometry with Non-Ideal CompensatorsJournal of the Optical Society of America, 1967
- Exact Theory of Retardation Plates*Journal of the Optical Society of America, 1964
- Analytical Determination of Optical Constants Based on the Polarized Reflectance at a Dielectric–Conductor Interface*Journal of the Optical Society of America, 1964
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962
- XXV. Optical constants of metals in the, infra-red—Principles of measurementJournal of Computers in Education, 1955
- On Calculating the Optical Constants from Reflection CoefficientsJournal of the Optical Society of America, 1939