Incident Angle Dependence of Secondary Electron Emission from Copper with Multiple Elastic Scattering of Primary Electron in the Muffin-Tin Potential
- 1 July 1990
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 29 (7R) , 1316-1321
- https://doi.org/10.1143/jjap.29.1316
Abstract
A Monte Carlo simulation of the secondary electron emission from a copper metal bombarded with low-energy electrons is carried out for analyzing its dependence on the angle of incidence. For the simulation, the differential cross section and the mean free path of the elastic collision of low-energy electrons in bulk copper are calculated with the muffintin approximation for a crystal potential. The mean free path (m.f.p.) is larger than the nearest-neighbor distance even at very low energy (10 eV), while the m.f.p. with an isolated atom potential is smaller than the distance at any energy of less than 1120 eV. The calculated angular dependence of the secondary electron yield is more consistent with an experimental dependence than that for the isolated atom potential.Keywords
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