4H-SiC IMPATT Diode Fabrication and Testing

• 1 April 2002
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 389-393, 1353-1358
• https://doi.org/10.4028/www.scientific.net/msf.389-393.1353

Abstract

Keywords

• AVALANCHE BREAKDOWN
• ELECTRON DRIFT VELOCITY
• IMPATT DIODES
• MICROWAVE OSCILLATIONS