Analysis of Trapped Image Guides Using Effective Dielectric Constants and Surface Impedances
- 23 March 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 82, 295-297
- https://doi.org/10.1109/mwsym.1982.1130696
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Trapped Image Guide For Millimeter-Wave CircuitsIEEE Transactions on Microwave Theory and Techniques, 1980
- Electric Probe Measurements on Dielectric Image Lines in the Frequency Range of 26-90 GHzIEEE Transactions on Microwave Theory and Techniques, 1978