Scanning electron microscopy of tribochemical films on Si3N4 to H2O at high temperatures
- 31 August 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 37 (1-4) , 239-246
- https://doi.org/10.1016/0304-3991(91)90022-x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Oxidation Studies of Crystalline CVD Silicon NitrideJournal of the Electrochemical Society, 1989
- Effect of Water Vapor on the Oxidation of Hot‐Pressed Silicon Nitride and Silicon CarbideJournal of the American Ceramic Society, 1976