Writing and reading perpendicular magnetic recording media patterned by a focused ion beam
- 12 February 2001
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 78 (7) , 990-992
- https://doi.org/10.1063/1.1347390
Abstract
We have written and read bit patterns on arrays of square islands cut with a focused ion beam into granular perpendicular magnetic recording media. Using a static write–read tester, we have written square-wave bit patterns on arrays of islands with sizes between 60 and 230 nm, matching the recording linear density to the pattern period. These measurements reveal the onset of single-domain behavior for islands smaller than 130 nm, in agreement with magnetic force microscope images. The recording performance of patterned regions is systematically compared to that of unpatterned regions.Keywords
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