The Robustness of the Terminal Decline Phenomenon: Longitudinal Data From the Digit-Span Memory Test
- 1 November 1989
- journal article
- research article
- Published by Oxford University Press (OUP) in Journal of Gerontology
- Vol. 44 (6) , P184-P186
- https://doi.org/10.1093/geronj/44.6.p184
Abstract
The robustness of terminal decline was studied by analyzing longitudinal results from the simple Digit-Span Memory Test. The subjects participated in the Gothenburg longitudinal study and were first examined at the age of 70. A nalyses were conducted for different groups according to subsequent survival. The findings provided support for the robustness of the terminal decline phenomenon.Keywords
This publication has 2 references indexed in Scilit:
- Is Terminal Drop Pervasive or Specific?Journal of Gerontology, 1988
- Seventy‐year‐old People in Gothenburg A Population Study in an Industrialized Swedish CityActa Medica Scandinavica, 1975