Quantitative electron probe microanalysis for the characterization of thin carbon-boron layers in fusion devices
- 1 January 1991
- journal article
- review article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 341 (5) , 315-319
- https://doi.org/10.1007/bf00321926
Abstract
No abstract availableKeywords
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- Sur les bases physiques de l'analyse ponctuelle par spectrographie XJournal de Physique et le Radium, 1955