Radiotracer Identification of Ti, V and Cr Band Gap States in 4H- and 6H-SiC

• 1 February 1998
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 264-268, 541-544
• https://doi.org/10.4028/www.scientific.net/msf.264-268.541

Abstract

Keywords

• BAND OFFSET
• CHROMIUM
• DEEP LEVEL
• DLTS
• TITANIUM (TI)
• TRANSITION METAL
• VANADIUM