Electromigration and charging effects during auger and xps analysis of insulators
- 1 July 1986
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 9 (2) , 133-134
- https://doi.org/10.1002/sia.740090213
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Some considerations on the electric field induced in insulators by electron bombardmentJournal of Applied Physics, 1986
- Electron beam damage in Auger electron spectroscopyApplications of Surface Science, 1981
- Decrease of the alkali signal during auger analysis of glassesJournal of Non-Crystalline Solids, 1980